Common problems researchers identify · 01Analog and RF Circuit Design
639 papers21.5% of this theme group
Researchers discuss challenges in designing and testing high‑precision analog and RF integrated circuits.
Integrated circuit (327) · Electronic circuit (231) · Mixed-signal integrated circuit (75) · Electronic engineering (89)
Design and test of analog circuits towards sub-ppm level
Design of CMOS RF Integrated Circuits and Systems
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Common problems researchers identify · 02Nano‑CMOS Device Scaling
513 papers17.2% of this theme group
Papers highlight material, device, and modeling issues as transistor dimensions approach nanometer scales.
Transistor (214) · CMOS (189) · Electronic circuit (118) · Nanoelectronics (36)
Nanoelectronic Materials, Devices and Modeling: Current Research Trends
1Meeting the Design Challenges of nano-CMOS Electronics
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Common problems researchers identify · 03Reliability and Security of Hardware
506 papers17.0% of this theme group
Works examine process variation, reliability engineering, and hardware Trojan threats in integrated circuits.
Reliability (150) · Hardware security module (37) · Reliability engineering (58) · Hardware Trojan (25)
Reliability- and Process-variation aware design of integrated circuits — A broader perspective
Device Reliability to Circuit Qualification: Insights and Challenges
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Common problems researchers identify · 04Power Semiconductor Materials
496 papers16.7% of this theme group
Studies focus on device performance and limitations of silicon carbide and emerging power semiconductor technologies.
Semiconductor (268) · Semiconductor device (123) · Power semiconductor device (82) · Silicon carbide (44)
Power-Semiconductor Devices and Components for New Power Converter Developments: A key enabler for ultrahigh efficiency power electronics
Research and Progress on Organic Semiconductor Power Devices
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Common problems researchers identify · 05Advanced IC Packaging Challenges
471 papers15.8% of this theme group
Research addresses interconnection, soldering, and wafer‑level packaging difficulties for high‑density circuits.
Integrated circuit packaging (74) · Wafer (92) · Soldering (53) · Interconnection (96)
Advancing Electronic Packaging Using Microsolder Balls: Making 25-nm Pitch Interconnection Possible
Moldability Challenges Associated with the Assembly of Thicker IC Packages for High Voltage and Power Applications
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Common problems researchers identify · 063‑D IC Design and Test
200 papers6.7% of this theme group
Authors investigate stacking, through‑silicon vias, and testing complexities in three‑dimensional integrated circuits.
Three-dimensional integrated circuit (93) · Integrated circuit (91) · Stacking (28) · Through-silicon via (24)
Test Challenges for 3D Integrated Circuits
3D integration: Circuit design, test, and reliability challenges
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Common problems researchers identify · 07Silicon Photonics Integration
153 papers5.1% of this theme group
Papers explore photonic integrated circuits and silicon‑based optical communication approaches.
Photonics (113) · Photonic integrated circuit (72) · Silicon photonics (34) · Integrated circuit (66)
Photonic Integrated Circuits for Optical Communication
Silicon Photonics Technologies for Monolithic Electronic-Photonic Integrated Circuit Applications
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